Posted on June 5, 2015 by abtiwari
Landon IP India is excited to announce that it is offering PRG’s Patent Bar Review Course in Bangalore in July. This is the same industry-leading course that, until now, was exclusively offered in the United States.
This is the perfect course for anyone wanting to understand how U.S. patent examiners and patent attorneys are taught about patent law. Attendees can leverage similar approaches, and the detailed knowledge of U.S. patent law obtained through this course, to confidently support projects related to U.S. patent applications.
This 5-day classroom course is offered at The Zuri Whitefield in Bangalore on July 20-24, 2015, at a cost of 1,40,195 INR per student, which includes the following benefits:
- Attendance at this classroom course
- 1 year of access to the PRG online course
- 1 year of access to the PRG online patent bar exam prep software — ExamWareTM — a great tool for reinforcing what you have learned
For more information, please visit PRG’s website. To register for the July program in Bangalore, please complete the registration form (one completed form per attendee) and return it to Yati Agarwal of Landon IP India at firstname.lastname@example.org. In addition, if you have any questions about this course, please contact Ms. Agarwal at this same email address.
Filed under: Items of Interest, Patent Analysis, Patent Search News, Search Tips and Tricks | Tagged: Landon IP, PRG, US patent law, US Patent Laws | Leave a comment »
Posted on April 15, 2015 by abtiwari
Landon IP expert Kartar Arora, who is the Technical Lead for the Patent Search Group’s Chemistry team, will be speaking at the Patent Information Users Group’s (PIUG) 2015 annual conference on the topic of “Valuation of IP from Cradle to Grave – Guidelines for Patent Search Professionals”. His presentation will cover guidelines that can be followed by patent search professionals to better understand the goals of IP management and focus their efforts in meeting these goals. This presentation will also discuss ideas for a comprehensive system for valuation of IP that can be applied from ideation to various events during the lifetime of a patent.
The PIUG conference will be taking place from Saturday, May 2 through Thursday, May 7, 2015 at the Westin Lombard Yorktown Center in Lombard, Illinois. Mr. Arora’s presentation will take place on May 5 from 2:35pm – 3:05pm.
Mr. Arora holds a Ph.D. in Polymer Science and Chemistry from the University of Michigan and is a Registered Patent Agent. In addition to his patent searching experience, he has experience with patent prosecution, drafting of patent applications, monitoring and coordination of patenting activities, and patent management systems.
Landon IP Reference Desk Librarian Joelle Mornini will also be attending this event. For those of you who can’t be there, Ms. Mornini will be live-tweeting her impressions and reactions to key presentations and announcements throughout the conference on the Intellogist Twitter feed.
This post was contributed by Abhishek Tiwari. The Intellogist blog and Intellogist are provided for free by Landon IP, which is a CPA Global company. Landon IP is a major provider of professional services meeting the needs of the IP community, including patent searches; analytics and technology consulting; patent, legal, and technical translations; and information research and retrieval.
Filed under: Items of Interest, Search Tips and Tricks | Tagged: conference, patent search, Patent Searchers, PIUG | Leave a comment »
Posted on January 15, 2015 by abtiwari
PatentClassifier, a new, free patent classification search tool, has been launched. The search tool is designed to suggest the patent classes closest to the phrases or words used to describe a particular patent. Get a low down on it after the jump!
Filed under: Intellogist Updates, Items of Interest, Patent Search Systems, Patent Search Tools, Search Tips and Tricks | Tagged: classification, patent, PatentClassifier | 1 Comment »
Posted on December 19, 2014 by jmornini
The holidays may be right around the corner, but patent database vendors and patent authorities are still busy updating their search systems and websites with interesting new features to improve your user experience and efficiency while utilizing their tools. Let’s take a quick look at updates from the past three months (since our last round-up in September) to major subscription patent search systems, including PatBase, Orbit, and Thomson Innovation, as well as free patent search tools like Espacenet and the USPTO website.
Learn about the new semantic search form that will be added to Orbit, free Chinese patent file histories available on Espacenet, and a new version of the USPTO website, after the jump!
Filed under: Intellogist Updates, Items of Interest, Patent Search News, Patent Search Systems, Patent Search Tools, Search Tips and Tricks | Tagged: Espacenet, Orbit, patbase, thomson innovation, USPTO website | Leave a comment »
Posted on June 19, 2014 by jmornini
A new Intellogist System Report on PatSeer, a patent search and analysis platform created by Gridlogics, is now available! Gridlogics, who also created the patent analysis platform Patent iNSIGHT Pro, launched PatSeer in May 2012. PatSeer coverage includes INPADOC bibliographic and abstract patent coverage, plus full text coverage of 15 patent authorities, as well as additional image, family data, legal status information, citation data, and corporate tree information. PatSeer is a relatively new patent search system that includes a variety of search interfaces, collaboration tools, and analysis options that both novice and advanced searchers will find intuitive and easily accessible. The Coverage Map and Quick Tables on Intellogist have also been updated with information on PatSeer, so compare PatSeer’s coverage and features with similar patent search tools!
Continue reading to learn about some of the unique features of PatSeer highlighted in the Intellogist Report, such as the in-depth filtering options and the Patent Dashlets™ (business dashboards) that can be shared with colleagues and clients!
Filed under: Intellogist Updates, Items of Interest, Patent Analysis, Patent Search News, Patent Search Systems, Search Tips and Tricks | Tagged: Gridlogics, Intellogist Report, Intellogist update, patent analysis, Patent iNSIGHT Pro, patent search, Patent Search Systems, PatSeer | Leave a comment »
Posted on September 16, 2013 by Kristin Whitman
I admit that the title of this post is a bit optimistic, given that I am far from a patent legal status expert myself, even after years of wading through the topic! But I do have a secret weapon that often saves me from appearing totally clueless – the European Patent Office (EPO)’s Statistics, Coverage and Codes documentation pages.
In this post I’ll discuss a small fraction of the useful content available on the “Useful tables and statistics, codes and coverage” pages on www.epo.org. These pages offer in-depth documentation of common patent bibliographic sources that are probably used by your commercial search provider. Read on to learn how these pages can save your bacon someday.
Filed under: Patent Search Systems, Search Tips and Tricks | Leave a comment »
Posted on June 23, 2013 by jmornini
USPTO’s PAIR provides invaluable status information for US patent documents, but accessing this information can be tedious and frustrating due to PAIR’s inconvenient user interface. Users must continually enter reCAPTCHA data to access the search form, very limited search options are available through the search form, and the portal will time out on you after a few minutes of inactivity. Wouldn’t it be nice to find an alternative to PAIR for searching US patent status data?
Now there is an alternative, at least for US patent reexamination records. Patent Savant, a web portal created by Patent Savant LLC, allows users to access patent reexam data for free through a much more user-friendly interface than PAIR, and subscribing users can access broader search options, alerts, and annotation tools.
After the jump, learn how to search US patent reexam data for free on Patent Savant!
Filed under: Patent Search Systems, Search Tips and Tricks | Tagged: PAIR, Patent Savant, reexam data | Leave a comment »