Patent Search System News Round-up, Winter 2015

The new year has brought a new round of updates from major patent search systems, including subscription databases PatBase, PatBase Express, and Relecura and free tool the Lens (formerly known as Patent Lens).  What’s new on these systems?  Here’s just a quick sample:

  • New design search commands and litigation information on PatBase.
  • Limit search and display to a specific country in PatBase Express.
  • Search history and non-US assignment data in now on Relecura.
  • New analysis and filtering options for genomic patent searches are available on The Lens.

Continue reading to get the full scoop on all the newly added improvements to these systems!
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New PatSeer Updates Released

The latest update of patent search and analysis platform PatSeer comes with key enhancements and new features, including the addition of Philippines full-text patent collection and new keyboard shortcuts. Let us take a detailed look at the updates after the break.

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IFI Claims Releases 2014 U.S Patents Trends and Insights Report

Patent database and analytical solutions provider IFI Claims has published a report based on an analysis of 2014 US Patent and Trademark Office data. In addition to highlighting notable trends in the granted U.S utility patents, the company has also released a list of the 50 companies that received the highest number of patent grants in the year 2014 by the USPTO. Get the lowdown on the report after the break!

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New Updates for the AcclaimIP Patent Search System

Subscription based patent search and analysis platform AcclaimIP has rolled out new updates pertaining to assignee names and data export options that are designed to streamline the patent search process and make it easier for users to export the right data. Get more details after the jump!

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A New Intellogist System Report on PatSeer: Top 5 Highlights!

A new Intellogist System Report on PatSeer, a patent search and analysis platform created by Gridlogics, is now available!  Gridlogics, who also created the patent analysis platform Patent iNSIGHT Pro, launched PatSeer in May 2012.  PatSeer coverage includes INPADOC bibliographic and abstract patent coverage, plus full text coverage of 15 patent authorities, as well as additional image, family data, legal status information, citation data, and corporate tree information. PatSeer is a relatively new patent search system that includes a variety of search interfaces, collaboration tools, and analysis options that both novice and advanced searchers will find intuitive and easily accessible.  The Coverage Map and Quick Tables on Intellogist have also been updated with information on PatSeer, so compare PatSeer’s coverage and features with similar patent search tools!

Continue reading to learn about some of the unique features of PatSeer highlighted in the Intellogist Report, such as the in-depth filtering options and the Patent Dashlets™ (business dashboards) that can be shared with colleagues and clients!

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A Free Report to Simplify Patent File History Analysis and Claims Comparison!

Landon IP is now offering for a limited time a free Prosecution Summary and Claims Comparison Report with every US patent file history order! See a sample of the Claims Comparison Report here.  Request the Comparison Report next time you need a patent file history, and receive these indispensable tools within a single convenient Microsoft Excel spreadsheet:

  • Claims Comparison: This table shows all changes to the text of every claim from application through patent grant, with a marked-up comparison between each version of the claim.
  • Evolved Claim®: A view of each patent claim that quickly summarizes how they evolved during prosecution, and in what paper each change was made.
  • Claims Tree: An easy-to-read chart visualizing the dependencies of all patent claims.
  • Prosecution Summary: A simple summary of key bibliographic data about the patent, including a summary of how the claims changed within each paper of the file.

Continue reading for an in-depth look at each of these tools within the free Report, and see how you can use them to analyze the file history and claims to support legal opinions, infringement analysis, Markman hearings, and more!

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Meeting the Challenges of Data Collection and Analysis

As a leader in patent analysis, Landon IP has expert searchers who answer complex questions on a daily basis to produce the highest quality results. If you work with patents, you know the obstacles we face: data collections are huge and unwieldy; errors in the data are rampant; and in short, nothing involving patent data is ever easy. Today, I’m going to share some of our most basic strategies for producing high-quality datasets that lead to reliable results. Read on to get an insight into these best practices.

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