A new Intellogist System Report on PatSeer, a patent search and analysis platform created by Gridlogics, is now available! Gridlogics, who also created the patent analysis platform Patent iNSIGHT Pro, launched PatSeer in May 2012. PatSeer coverage includes INPADOC bibliographic and abstract patent coverage, plus full text coverage of 15 patent authorities, as well as additional image, family data, legal status information, citation data, and corporate tree information. PatSeer is a relatively new patent search system that includes a variety of search interfaces, collaboration tools, and analysis options that both novice and advanced searchers will find intuitive and easily accessible. The Coverage Map and Quick Tables on Intellogist have also been updated with information on PatSeer, so compare PatSeer’s coverage and features with similar patent search tools!
Continue reading to learn about some of the unique features of PatSeer highlighted in the Intellogist Report, such as the in-depth filtering options and the Patent Dashlets™ (business dashboards) that can be shared with colleagues and clients!
1. Numerous Search Form Options with a Wide Variety of Help Features
PatSeer includes a number of search form options, including fielded search forms (Easy Search, Simple Search, and Field Search), a Number Search, Natural Language Search, and a Command Line Search. A wide range of search tools and help features are available to guide the user through the searchable data fields and allowed operators, ranging from search tools in the fielded search forms (such as the Semantic Search Suggester and Corporate Tree lookup) to a side menu of tools available under all search forms (term translator, term index, search class definitions, chemistry lookup, view and add to saved search scripts, and view all data fields in a table). The user can also at any time choose to open the Help and Support dialog window, where they can contact technical support directly or open the Knowledge Base, which contains a database of help articles related to PatSeer.
2. Use Faceted Filtering Options for Search Result Hit Lists or Projects
The result lists on PatSeer (including the search results Hit List, the Quick List, and the Project Hit List) provide a filtering menu that offers very granular filtering options, allowing the user to select from automatically generated facets under a wide variety of fields using check boxes or by entering the facets and additional keywords in a search form. The filter menu is arranged with collapsible fields that provide easy viewing and manipulation options via check boxes and icons.
3. Multiple Citation Analysis and Family Viewer Tools
Under the Full Record View on PatSeer, a variety of options for viewing and analyzing both citations and patent family members are available. Under the Family tab, select to view tables listing all related members of the Simple Family or Extended Family, and also select to view a Family Tree (visualization of the relationship between family members) or a Family Coverage Map (visualization of the countries of publication for family members). Under the Citation tab, view a table displaying Backward Citations, Forward Citations, a Citation Tree (visualization of the relationship of the subject patent to related citations), table of Other References, Backward Co-Cites (with relevancy score), or Forward Co-Cites (with relevancy score).
4. Easily Create Layered Charts through Quick Stats Tab
The main analysis option on PatSeer is easily accessible under the Quick Stats tab (located behind any results list) where users can select from a variety of chart options to create customized charts based on the result set. Users can add multiple layers to the chart, based on additional fields or queries.
5. Create Innovative Patent Dashlets for Projects
Under a Project on PatSeer, create a customized dashboard (Dashlet) that displays selected fields for each record in a Project (or for selected groups). Select which fields and icons to display in the Dashlet through this menu. Dashlets can have interactive custom fields per column that can be set to view/read-only/editable from the project permission settings.
These are just a few of the search, display, analysis, collaboration, and coverage features described in the new PatSeer System Report! Check out the new PatSeer Report, along with the updated Coverage Map and Quick Tables, over on Intellogist.
Have you tried PatSeer? Share your experiences with this patent search system in the comments!
This post was contributed by Joelle Mornini. The Intellogist blog is provided for free by Intellogist’s parent company Landon IP, a major provider of patent searches, trademark searches, technical translations, and information retrieval services.
Filed under: Intellogist Updates, Items of Interest, Patent Analysis, Patent Search News, Patent Search Systems, Search Tips and Tricks | Tagged: Gridlogics, Intellogist Report, Intellogist update, patent analysis, Patent iNSIGHT Pro, patent search, Patent Search Systems, PatSeer |