[tweetmeme source=”Intellogist” only_single=false] In a past blog post, I looked at some of the notable features of the Common Citation Document (CCD), a free tool where you can view citations from the EPO, USPTO, JPO, and PCT for entire patent families related to a specific patent application. Check out the first blog post for an overview of CCD coverage, search, and display features; you’ll be impressed by the wide range of functions offered by the tool, including multiple panes for viewing lists and patent documents simultaneously and a timeline visualization feature for viewing the timespan for a collection of citations. One of the most noteworthy traits of the CCD is its customization options for viewing information. The CCD allows you to control the flow of information and the final output of the citation data, so you are only viewing the data that is relevant to you. Whether you are a patent examiner who wants a detailed list of citations in the format of a PCT international search report, or you’re a patent searcher looking for a simple, direct list of related prior art, the CCD offers viewing options that meet many types of user needs.
Continue reading to learn about the flexible options for viewing patent citation data on the CCD!
Filed under: Patent Search News, Patent Search Systems, Search Tips and Tricks | Tagged: CCD, citation searching, EPO | Leave a comment »