Posted on December 26, 2012 by jmornini
Another year has come and gone, and it’s that time in December where we’re all racing to the nearest mall (or Amazon) to shop for holiday gifts for the important people in our lives. Patent searchers enjoy getting presents too, and each database update is a small gift of new features and tools to improve the prior art search and analysis processes. New databases and search platforms are the equivalent of a new bicycle or Xbox, and searchers can’t wait to take the new system for a test ride. Like last year, I’d like to highlight a few of my favorite patent search gifts that I’ve received in the last twelve months, including updates and new platforms for both free and subscription patent search systems. Over the past year, there have been major updates to Orbit.com, Google Patents, and Espacenet, and I’ve been impressed by new patent search tools like the CCD and WIPS Global ADVANCED. Patent searchers have received an abundance of gifts this year, but professionals who work with patent file histories shouldn’t feel left out, either: they can take an innovative new patent file history service for a free test ride!
After the jump, learn about the best patent search system updates and new tools of 2012, as well as a unique resource for professionals who review patent file histories!
Filed under: Patent Search News, Patent Search Systems, Search Tips and Tricks | Tagged: CCD, Espacenet, Google Patents, orbit.com, patent search, Patent Workbench, WIPS Global Advanced | Leave a comment »
Posted on March 13, 2012 by jmornini
[tweetmeme source=”Intellogist” only_single=false] The WIPS Global Intellogist Report has been fully updated, and the big news is that a new system, WIPS Global ADVANCED, will be replacing WIPS Global version 4 by March 2013. Last week we looked at the patent coverage and search features on WIPS Global ADVANCED, including the integrated search forms, step search options, and the new family, citation, and company search forms. Now, let’s explore the result display and analysis features for the system, such as an Easy Viewer option to quickly scroll through search results and the SmartAngle analysis tool for analyzing collections of results.
Read on to learn about the analysis and viewing features of WIPS Global ADVANCED, and I’ll summarize what I felt were the main strengths and weaknesses of the system!
Filed under: Intellogist Updates, Patent Analysis, Patent Search News, Patent Search Systems, Search Tips and Tricks | Tagged: Intellogist update, patent analysis, patent search, WIPS Global, WIPS Global Advanced | 4 Comments »
Posted on March 6, 2012 by jmornini
[tweetmeme source=”Intellogist” only_single=false] Hot on the heels of the updated Inspec Intellogist Report, we now have a fully updated WIPS Global Intellogist Report. WIPS Global hasn’t seen too many changes since 2009, but some recent updates include:
- The latest version of ThinKlear Beta 0.1.1.0 became available on the WIPS Global website in February 2009. This version only incorporated minimal changes, however.
- According to an informational pamphlet titled “WIPS Introduction,” WIPS obtained an ISO 27001 security certification in 2010.
- All full document images on WIPS were replaced with PDF files in January 2011. The PIView program is no longer needed to review patent images on WIPS Global.
The biggest update, however, is that the current version of WIPS Global 4.0 will soon be retired, and a new system called WIPS Global ADVANCED
will be taking its place! The service was launched on February 1, 2012, and WIPS Global ADVANCED will completely replace WIPS 4.0 by March 31, 2013.
After the jump, we’ll look at the patent coverage and search options available on WIPS Global ADVANCED!
Filed under: Intellogist Updates, Patent Analysis, Patent Search News, Patent Search Systems, Search Tips and Tricks | Tagged: Intellogist update, patent analysis, patent search, WIPS Global, WIPS Global Advanced | Leave a comment »