The Next Generation of WIPS Global: WIPS Global ADVANCED – Part 1

Hot on the heels of the updated Inspec Intellogist Report, we now have a fully updated WIPS Global Intellogist Report.  WIPS Global hasn’t seen too many changes since 2009, but some recent updates include:

  • The latest version of ThinKlear Beta 0.1.1.0 became available on the WIPS Global website in February 2009.  This version only incorporated minimal changes, however.
  • According to an informational pamphlet titled “WIPS Introduction,” WIPS obtained an ISO 27001 security certification in 2010.
  • All full document images on WIPS were replaced with PDF files in January 2011.  The PIView program is no longer needed to review patent images on WIPS Global.
The biggest update, however, is that the current version of WIPS Global 4.0 will soon be retired, and a new system called WIPS Global ADVANCED will be taking its place!  The service was launched on February 1, 2012, and WIPS Global ADVANCED will completely replace WIPS 4.0 by March 31, 2013.
After the jump, we’ll look at the patent coverage and search options available on WIPS Global ADVANCED!

Coverage and Search Options

WIPS Global ADVANCED covers US, EP, PCT, JP, KR, CN, and DOCDB patent document data (and legal statuses for DOCDB).  For a more detailed coverage chart, look at the WIPS Global ADVANCED Community Report over on Intellogist.

When signing in to WIPS Global ADVANCED, the user has the option to use a secure connection (SSL). After signing in, the user has access to a number of search forms:

  • Integrated Search- An advanced search form or a step search form are accessible under two different tabs, and users can select from any or all available countries/authorities through both integrated forms. Switching between the two tabs will automatically clear both forms, including all search history for the step form.
    • Advanced Search – Select the country coverage, date range, and enter the search query in either the command line search form or the search fields listed below the command line (all search fields are connected by AND).  Below the search form, available tools include a query matching board (retrieve matching queries from the query folder and query history), error check to identify any errors in the query syntax, a list of available operators, a list of available field abbreviations, and a link to a chart for correctly formatting patent numbers.

    Use the command line form in the integrated advanced search tab. A reference chart for field operators is available below the command line form.

    • Step Search – The step search form is identical to the advanced form, except that search result numbers and queries are displayed in a “Step Search List”, where each query listed can be combined with other queries in the list. Once the user has selected the country and date coverage for the first search in a step list, they cannot alter the coverage unless they clear the entire list. Individual queries or the full search history can be saved by selecting one or all of the check boxes beside the queries in the step list and then selecting “save queries.” Users can create a folder to save the queries in, and up to 100 queries can be saved per folder. A memo can also be added to saved queries.
  • Step Search – Like the step search form for the “Integrated Search”, except that users can only search under individual country/authority coverage (arranged under seven tabs: US, EP, PCT, JP, KR, CN, DOCDB). Users can also select to only view priority documents under the tabs US, EP, PCT, JP, KR, and CN. Switching between tabs will automatically clear the search history in all forms.
  • Advanced Search – Like the advanced search form for the “Integrated Search”, except that users can only search under individual country/authority coverage (arranged under seven tabs: US, EP, PCT, JP, KR, CN, DOCDB). Users can also select to only view priority documents under the tabs US, EP, PCT, JP, KR, and CN. Switching between tabs will automatically clear the search criteria in all forms.
  • Number Search  – The number search only allows user to search under individual country/authority coverage (arranged under seven tabs: US, EP, PCT, JP, KR, CN, DOCDB). Users can select document type, whether or not to only view priority documents (for US, EP, PCT, JP, KR, and CN), and which document number types to search. The tips for formatting the specific authority’s patent numbers are listed directly below the search form. Users can utilize truncation operators in the number query to expand the search.
  • Family Search - The family search form is similar to the advanced search form, except that only six country/authority coverage tabs are available to search under: US, EP, PCT, JP, KR, CN (DOCDB option is missing). An additional set of options is available under each tab, where users can set a range for number of family documents, number of family countries, and select which family country profiles to include via check box (All, US, EP, PCT, JP, KR, CN, Etc). The results list includes the number of families, number of family countries, and a graphic representation of which authorities are included in the family.
  • Citation Search – The citation search allows users to select type of forward citation (All, Citation, Citation from description), forward citation depth (Forward Depth 1, ~ Forward Depth 2), which forward citation profiles to display (All, US, EP, PCT, JP, KR, CN, Etc), and the country and document kind for the specific document number being searched. The system notes that only granted US/EP/JP/KR documents are searchable. Search results include an icon indicating the root document and other icons identifying the citation type. These icons are listed under a “Cited Info” column in the search results, beside a “No. of F1″ column.
  • Company Search - The search form is similar to the integrated advanced search form (users can select from one or all available authorities to include in the search). Additional criteria that the user can select includes choosing whether to search for a sole application, a joint application, or all types (the user can also enter a range of numbers for the joint application). The user can enter a standardized applicant name, and all standardized applicant codes can be found by selecting “code search.”

    Code Search window for standardized applicant codes.

    Within the Code Search window, the user can search for a company name, select multiple standardized company results, and include these company results in a saved group. Up to three of these groups at a time can be included in a company search (select the group number and all company names in the group to be included in the search), or the user can conduct a search using a single applicant standardized code. All additional search criteria can be entered in the command line form below the applicant criteria. In the search results, an icon indicates whether the document was a sole application or joint application.

A classification code lookup link is also accessible in the upper right corner of the screen, and the link will open a window that allows users to search for IPC, UPC, FI/F-term, and ECLA codes. THe FI/F-term definitions can be viewed in English or Japanese.

Next Week…
WIPS Global ADVANCED offers some additional search forms that weren’t previously available on WIPS Global version 4, including the family, citation, and company search options.  The coverage of WIPS Global ADVANCED is comparable to the current WIPS Global coverage (minus the discontinued G-PAT collection (DE, FR, GB, CH) that only appears accessible on the  WIPS Global v.4).  WIPS Global ADVANCED did inherit some of the problems  from WIPS Global v. 4, such as lack of left-hand truncation operators.

 

Next week, we’ll look at the result display and analysis options available on WIPS Global ADVANCED!  I’ll also give a summary of the overall strengths and weaknesses that I found while testing the system.  Users can test WIPS Global ADVANCED themselves by requesting a free trial.

 

What do you think of the search features and patent coverage available on WIPS Global ADVANCED?  Let us know your opinions on the system!

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This post was contributed by Joelle Mornini. The Intellogist blog is provided for free by Intellogist’s parent company Landon IP, a major provider of patent searches, trademark searches, technical translations, and information retrieval services.

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